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KMID : 0381920040340020095
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Korean Journal of Microscopy
2004 Volume.34 No. 2 p.95 ~ p.102
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TEM Sample Preparation of Heterogeneous Materials by Tripod Polishing and Their Microstructures
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김연욱/Kim YW
조명주/Cho MJ
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Abstract
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KEYWORD
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Cross-section TEM sample, Diffusion couple, Ion milling, Mechanical polishing, Stainless steel
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